Invited Speakers

The following plenary and keynote speakers have so far confirmed their participation in SILS 2019:

Lorenzo Avaldi (CNR-ISM)
Examples of coherence in atomic and molecular photoionization by a single photon (synchrotron radiation) and few photons (FEL)

Alessandro Baraldi (University of Trieste)
The enticing interaction of graphene with atoms, molecules, clusters and surfaces

Marine Cotte (European Synchrotron Radiation Facility)
Ultra-modern synchrotron-based microscopes for the study of ancient materials: a review of applications to Roman/Italian artefacts and/ or by Italian researchers

Vitaliy Feyer (Forschungszentrum Jülich, Peter Grünberg Institute)
Molecular Orbital Tomography: efficient method to study the adsorption geometry and electronic structure

Giacomo Ghiringhelli (Politecnico of Milano)
High resolution Resonant Inelastic X-ray Scattering for the study of correlated materials

Luca Giannessi (Elettra-Sincrotrone Trieste)
FERMI: the first externally seeded Free Electron Laser in the extreme ultraviolet and soft X-ray spectral regions

Silvano Lizzit (Elettra-Sincrotrone Trieste)
Current status and future perspectives of Elettra and FERMI

Stefano Lupi (Sapienza University of Rome)
Terahertz and Infrared Synchrotron Radiation: Coherence helps its use?

Calogero Renzo Natoli (LNF-INFN)
Some odd consequences of self-coherence in the photo-diffraction and photo-absorption processes

Giorgio Margaritondo (Ecole Polytechnique Fédérale de Lausanne)
Microtomography with Coherent Synchrotron Radiation: Mapping the Human Brain

Fabrizio Nestola (University of Padova)
Diamonds: a deep journey into the Earth

Sakura Pascarelli (European XFEL)
The European XFEL: start of user operation and first results

Riccardo Pompili (INFN-LNF)

Pantaleo Raimondi (European Synchrotron Radiation Facility)
Twenty six years of operation of the ESRF Synchrotron and the EBS Project

Ian Robinson (University College London)
4D Bragg Coherent Diffraction Imaging of Nanocrystals using XFELs

Giorgio Rossi (University of Milano)
Measuring linear and nonlinear response by the photoelectric effect: first order diffraction and higher-order in 3D and 2D systems

Thomas Sheppard (Karlsruhe Institute of Technology)
Harnessing X-ray (Spectro)microscopy for Chemical Imaging of Heterogeneous Catalysts